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Industrial Analysis Program

Filter Analysis

Developed as an in-house test method to allow the assessment of debris resultant from used filter flushing. It is designed to examine debris by its metallurgical constituents. The resultant, dry, filtered sample is placed in the SEM (Scanning Electron Microscope) and bombarded with electrons which release X rays characteristic of the element that they hit. The wavelengths of the emitted  rays are used to determine the elemental composition of the sample.